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Resource Record Summary

Catalog Service:
Chandra Multiwavelength Project (ChaMP) Point Source Catalog

Short name: ChaMPPS
IVOA Identifier: ivo://nasa.heasarc/champpscPublisher: NASA/GSFC HEASARC[+][Pub. ID]
More Info: https://heasarc.gsfc.nasa.gov/W3Browse/all/champpsc.html
VO Compliance: Level 2: This is a VO-compliant resource.
Status: active
Registered: 2025 Apr 25 00:00:00Z
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Description


This table represents the `Main Chandra Multiwavelength Project (ChaMP) X-Ray Point Source Catalog' and contains the basic parameters, photometry, and fluxes of 6512 ChaMP sources in 130 Chandra observations from Chandra Cycles 1 and 2. This table lists fluxes for 2 assumed spectral energy distributions with the photon indices of Gamma=1.4 and Gamma=1.7. This catalog was distributed by the ChaMP team based on the "Chandra Multiwavelength Project: X-ray Point Source Catalog (Kim et al., 2007, ApJS, 169, 401)", and was downloaded from <a href="http://hea-www.harvard.edu/CHAMP/">http://hea-www.harvard.edu/CHAMP/</a>. If you have any comments/questions on this catalog, please contact mkim @ cfa.harvard.edu or dkim @ cfa.harvard.edu. The full Chandra Multiwavelength Project (ChaMP) X-ray point source catalog lists ~ 6800 X-ray sources detected in 149 Chandra observations covering ~ 10 square degrees. The full ChaMP catalog sample is 7 times larger than the initial published ChaMP catalog (Kim et al. 2004, ApJS, 150, 19). The exposure times of the fields in this sample range from 0.9 to 124 ks, corresponding to a deepest X-ray flux limit in the 0.5 - 8.0 keV band of 9 x 10<sup>-16</sup> ergs cm<sup>-2</sup> s<sup>-1</sup>. The ChaMP X-ray data were uniformly reduced and analyzed with ChaMP-specific pipelines and then carefully validated by visual inspection. The ChaMP catalog includes X-ray photometric data in eight different energy bands as well as X-ray spectral hardness ratios and colors, source reliability, detection probability, and positional uncertainties. The false source detection rate is ~1% of all detected ChaMP sources, while the detection probability is better than ~ 95% for sources with counts >~ 30 and off-axis angle <5'. The typical positional offset between ChaMP X-ray source and their SDSS optical counterparts is 0.7" +/- 0.4", derived from ~ 900 matched sources. This HEASARC table contains the main ChaMP catalog of 6512 X-ray point sources in 130 ChaMP fields observed once and in the overlapping fields which had the longest exposures. It does not contain the supplementary ChaMP catalog of 853 sources in 19 ChaMP overlapping fields with shorter exposure times. This table was created by the HEASARC in October 2006 based on the table <a href="http://hea-www.cfa.harvard.edu/CHAMP/IMAGES_DATA/champ_xpc.tab">http://hea-www.cfa.harvard.edu/CHAMP/IMAGES_DATA/champ_xpc.tab</a> on the ChaMP website. This is a service provided by NASA HEASARC .

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Developed with the support of the National Science Foundation
under Cooperative Agreement AST0122449 with the Johns Hopkins University
The NAVO project is a member of the International Virtual Observatory Alliance

This NAVO Application is hosted by the Space Telescope Science Institute

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